Temperature-Dependent d₃₃ Tester_Gogo Instruments Technology (Shanghai) Co., Ltd.

The GoGo Instruments Temperature-Dependent d₃₃ Tester :It is a versatile measuring instrument developed based on practical experience. It applies a direct load to the test sample and measures the electric charge generated during loading to determine the piezoelectric coefficient of the material. This system enables the measurement of the d₃₃ piezoelectric coefficient of piezoelectric ceramics and thin films under varying temperature conditions. Notably, it operates without any pre-loading force, ensuring high accuracy and stability in test results.

1、Capable of measuring piezoelectric ceramics and thin-film materials.

2、Compatible with electrodes of any shape and size.

3、Suitable for samples with both in-plane and through-thickness electrode configurations.

4、Features a specialized temperature stage design for variable-temperature measurements. The temperature range can be extended with an optional hot/cold chamber accessory.

5、Allows free selection of applied force magnitude and number of measurements. The host software automatically calculates and displays the d₃₃ result.

Case Studies

TYPE	Temperature-Dependent d₃₃ Tester
Heating Method	BW-D33-001
Measurement Range	Electric Charge 1.5~30000pC
Force Application Range	±0.1℃（＞1000℃：±0.5℃）
Error Range	＜±5%
Temperature Range	RT~300℃,the optional heating and cooling stage (LRT-001) extends the temperature range to -100℃~500℃

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