GoGo Instruments Technology (Shanghai) Co., Ltd. specializes in temperature control technology, offering a range of patented products including probe heating/cooling stages, optical heating/cooling stages, in situ stretching stages, in situ XRD/SEM heating/cooling stages, ultra-high-temperature heating stages, and high/low-temperature test chambers, as well as testing systems for dielectric thermal spectra, electrocaloric effects, charge-discharge testing, and variable-temperature D33 measurements.

X-ray diffraction (XRD) technology is a research method that involves irradiating a material with X-rays, analyzing its diffraction pattern, and obtaining information about the material's composition, and the structure or morphology of its internal atoms or molecules.

X-ray diffraction analysis is a primary method for studying the phase and crystal structure of substances. When a substance (crystalline or non-crystalline) is subjected to diffraction analysis, it is irradiated by X-rays, producing diffraction phenomena of varying degrees. The composition, crystal form, intramolecular bonding, molecular configuration, and conformation determine the unique diffraction pattern of the substance. X-ray diffraction offers advantages such as non-destructiveness to the sample, no pollution, speed, high measurement accuracy, and the ability to obtain extensive information about crystal integrity. Consequently, as a modern scientific method for material structure and composition analysis, X-ray diffraction analysis has been widely adopted in various research and production applications.

X-ray diffraction analysis is now extensively used for qualitative or quantitative phase analysis, crystal structure analysis, material structure analysis, and the measurement of macro or micro stresses.

The Thermo Scientific™ ARL™ EQUINOX 3500 is an upgraded version of the ARL EQUINOX 3000. The EQUINOX 3500 is equipped with a detector featuring a larger radius of curvature, enabling the acquisition of high-resolution XRD data as needed.

The phase of a sample tested at different temperatures may change. An in-situ XRD heating/cooling stage can provide excellent variable temperature testing conditions for samples, thereby meeting the testing requirements of samples at different temperatures.

Based on customer requirements, GoGo Instruments customizes in-situ XRD heating/cooling stages suitable for X-ray structural studies of powder samples under variable temperatures, adapted for Thermo Fisher X-ray diffractometers for variable-temperature X-ray diffraction testing. The product features a replaceable top cover, allowing it to be used as a conventional heating/cooling stage; its height is adjustable to accommodate samples of different thicknesses.

This product includes a temperature controller, refrigeration controller, circulating water system, and accompanying PC-based temperature control software for easy temperature setting and data acquisition. Provided LabVIEW VIs facilitate customized programming by the customer.

Main Technical Parameters:

1. Temperature Control Range: -190℃ ~ 600℃ (in atmosphere), -190℃ ~ 400℃ (in vacuum);
2. Temperature Stability: ±0.1℃ (<600℃), ±1℃ (>600℃);
3. Temperature Resolution: 0.1℃;
4. Diffraction Angle (2θ): 0°to 164°;
5. Replaceable top cover for use as a conventional heating/cooling stage.

↑ In-situ XRD Heating/Cooling Stage Adapted for Thermo Fisher X-ray Diffractometer for Variable-Temperature X-ray Diffraction Testing ↑