SEM Hot/Cold & Tensile Stages feature non-invasive integration via external vacuum flanges. They provide precise thermal control and mechanical loading to capture highly stable, real-time microdynamic processes of samples. Fully compatible with major SEM brands including ZEISS, Hitachi, Thermo Fisher, and GIANT.

The SEM In-Situ Tensile Stage serves as a functional accessory for scanning electron microscopes (SEMs), requiring no instrument modification. It maintains EBSD compatibility and offers optional thermal modules (e.g., a 1200°C ultra-high temperature module) to enable synchronous study of microstructural evolution and in-situ mechanical responses in materials.