According to customer requirements, GoGo Instruments customized an in-situ SEM heating/cooling stage for the Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences. This stage is compatible with the Guoyi Quantum FIB-SEM DB500, supporting relevant testing and research.
The Guoyi Quantum Focused Ion Beam Microscope (FIB) DB500 features a self-developed, controllable field emission electron column and the "Chengying" ion column, making it an elegant and versatile tool for nano-analysis and sample preparation. Its High-Voltage Tunnel Technology (SuperTunnel), low-aberration and zero-stray-field objective lens design, and low-voltage high-resolution imaging ensure superior nano-analysis capabilities. The "Chengying" ion column utilizes a liquid gallium ion source, providing highly stable and high-quality ion beams to guarantee excellent nano-fabrication performance.
The GoGo Instruments In-situ SEM Heating/Cooling Stage is a sample stage applied within a Scanning Electron Microscope (SEM) – requiring no internal modifications to the microscope itself. It serves as an SEM accessory providing in-situ variable temperature testing for samples, suitable for studying the structural properties of various materials under high and low temperatures within the SEM.
GoGo Instruments SEM In-situ Heating/Cooling Stage
Main Technical Parameters:
1. Utilizes liquid nitrogen cooling, providing a low-temperature environment of ≤100K, with a stable hold time of ≥10 hours.
2. Sample stage dimensions: Circular stage Ø40mm, configured with a 20*20mm square sample well.
3. Sample stage material: Gold-plated copper.
4. Equipped with a high-voltage electrode supporting up to 10kV.
GoGo Instruments SEM In-situ Heating/Cooling Stage Testing Scene:

Site of the SEM In-situ Heating/Cooling Stage Adapted for Guoyi Quantum FIB