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Temperature Spectrum Measurement System is used to study the variation of dielectric properties (e.g., dielectric constant, loss factor, etc.) of materials (such as bulk materials, thin films, etc.) with temperature (thermal spectrum) and frequency (frequency spectrum). The core components of the system include an LCR meter, a probe-type hot/cold stage, and dedicated testing software, enabling precise measurement and analysis of the dielectric characteristics of materials under different temperatures and frequencies.
1. LCR Meter (Compatible with brands such as Keysight, Tonghui, Hioki, Wenke, etc.)
2. Electrical Heating and Cooling Stage (CH600-190-P4 Model ,etc.))
1、Temperature Range:﹣190℃~600℃/RT~1000℃ (Option)
2、Temperature Stability: ±0.1℃
3、Cooling/Heating Method: Liquid nitrogen cooling,Resistance heating
4、Sample Holder Material: Silver
5、Sample Holder Size: 23mm*23mm
6、Chamber：Atmosphere/Vacuum
7、Probe Material and Quantity: Gold-plated beryllium copper or gold-plated tungsten steel, 4 or 8 units (configurable).
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E-mail: wjw@gogoyq.com
Address: No. 308, Baichuanghui, Binhe Road, Suzhou, China
