The parallel plate capacitor method was used. The sample was placed on a temperature-controlled sample stage equipped with a silver-electroded ceramic disk. One probe contacts the sample's top electrode, while the other probe contacts the silvered layer of the ceramic disk, thereby connecting to the sample's bottom electrode for capacitance measurement. Before testing, the sample dimensions were measured and input into the software to automatically calculate the dielectric constant of the sample at different temperatures.

Ceramic Disk A-BT

• TCC shows good repeatability with minimal variation between different test cycles.

• The trends for Dk and Df are consistent during the initial test, temperature return, and second test, with minimal data variation.

Ceramic Disk B-BT

• TCC shows good repeatability with minimal variation between different test cycles.

• The trend for Dk is consistent across tests.

MLCC Product

• TCC shows good agreement across multiple tests, with a variation rate within ±15%.

• Cp test values range between 0.085μF and 0.115μF. The difference between the second (re-test) and first test values at the same temperature is within 7%.

• Performance under the 0.5V test condition aligns with the nominal specifications.

1.The test results for both the ceramic disks and the MLCC product meet the requirements. The TCC, Dk, and Df test results are consistent with previously measured data.

2.The temperature control accuracy is within ±0.1°C. At a heating rate of 3°C/min, the actual temperature difference during the sampling of four frequencies at the same temperature is <0.2°C, and the temperature difference between adjacent samples of the same type is ≤0.2°C. This matches the values stated in the system configuration sheet, confirming accurate temperature control and temperature measurement.

▲ Compatible with Tonghui TH2838